Scanning electron microscope Sample stage centre of a combined scanning electron microscope SEM scanning auger microscope SAM and scanning probe microscope SPM The SEM scans a sample with a beam of electrons The beam may be scattered off the sample or it may cause electrons to be emitted by it These electrons are collected and translated into a threedimensional image The SAM can find the chemical composition of a sample on a microscopic scale The SPM can image or alter material structures through the interaction of its probe with the materials surface Photographed at the Centre for Nanoscale Science and Technology at the University of Newcastle upon Tyne England
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Product ID: 22105921295A